SYNOPSIS

nvme [<global-options>] micron smart-log <device>

DESCRIPTION

For the NVMe device given, retrieves the SMART/Health Information log page and displays it with Micron vendor-specific fields decoded.

The <device> parameter is mandatory and may be either the NVMe character device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1).

This command extends the standard SMART log with Micron-specific fields:

OLEC (Operational Lifetime Energy Consumed)

Located at bytes 232-239 in the SMART log reserved area. Reports cumulative energy consumed by the device.

IPM (Interval Power Measurement)

Located at bytes 240-243 in the SMART log reserved area. Reports power measurement over sampling interval.

OPTIONS

GLOBAL OPTIONS

The following options are defined at the top-level nvme command and are available to this subcommand:

--dry-run

Print the command that would be executed, but do not actually execute it.

--no-ioctl-probing

Disable probing for 64-bit IOCTL support.

--no-retries

Disable retry logic on transient errors.

-o <fmt>
--output-format=<fmt>

Set the reporting format to normal, tabular, 'json, or binary. Only one output format may be used at a time.

--output-format-version=<version>

Select the output format version. Version 1 uses the original field naming, while version 2 (default) provides more consistent and script-friendly field names.

--timeout=<ms>

Set the timeout for the command in milliseconds.

-v
--verbose

Increase the level of detail in the output. May be specified multiple times to further increase verbosity.

EXAMPLES

  • Display SMART log in human-readable format: 

    # nvme micron smart-log /dev/nvme0

  • Display SMART log in JSON format: 

    # nvme micron smart-log /dev/nvme0 -o json

NVME

Part of the nvme-user suite