SYNOPSIS

nvme [<global-options>] virtium save-smart-to-vtview-log <device>
                        [--run-time=<NUM> | -r <NUM>]
                        [--freq=<NUM> | -f <NUM>]
                        [--output-file=<FILE> | -O <FILE>]
                        [--test-name=<NAME> | -n <NAME>]

DESCRIPTION

This command automates the process of collecting SMART data periodically and saving the data in a ready-to-analyze format. Each entry is saved with timestamp and in csv format. Users can use excel to analyze the data. Some examples of use cases are collecting SMART data for temperature characterization, data to calculate endurance, or collecting SMART data during a test or during normal operation.

The <device> parameter is mandatory and may be either the NVMe character device (ex: /dev/nvme0), or a namespace block device (ex: /dev/nvme0n1).

On success, the command generates a log file, which contains an entry for identify device (current features & settings) and periodic entries of SMART data.

This command runs for the time specified by the option <run-time>, and collects SMART data at the frequency specified by the option <freq>. If the output file name is not specified, this command will generate a file name that include model string and serial number of the device.

If the test-name option is specified, it will be recorded in the log file and be used as part of the log file name.

OPTIONS

-r <NUM>
--run-time=<NUM>

(optional) Number of hours to log data (default = 20 hours)

-f <NUM>
--freq=<NUM>

(optional) How often you want to log SMART data (0.25 = 15', 0.5 = 30', 1 = 1 hour, 2 = 2 hours, etc.). Default = 10 hours.

-O <FILE>
--output-file=<FILE>

(optional) Name of the log file (give it a name that easy for you to remember what the test is). You can leave it blank too, the file name will be generated as <model string>-<serial number>-<test name>.txt.

-n <NAME>
--test-name=<NAME>

(optional) Name of the test you are doing. We use this string as part of the name of the log file.

GLOBAL OPTIONS

The following options are defined at the top-level nvme command and are available to this subcommand:

--dry-run

Print the command that would be executed, but do not actually execute it.

--no-ioctl-probing

Disable probing for 64-bit IOCTL support.

--no-retries

Disable retry logic on transient errors.

-o <fmt>
--output-format=<fmt>

Set the reporting format to normal, tabular, 'json, or binary. Only one output format may be used at a time.

--output-format-version=<version>

Select the output format version. Version 1 uses the original field naming, while version 2 (default) provides more consistent and script-friendly field names.

--timeout=<ms>

Set the timeout for the command in milliseconds.

-v
--verbose

Increase the level of detail in the output. May be specified multiple times to further increase verbosity.

EXAMPLES

  • Temperature characterization: 

    # nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=0.25 --test-name=burn-in-at-(-40)

  • Endurance testing: 

    # nvme virtium save-smart-to-vtview-log /dev/yourDevice --run-time=100 --record-frequency=1 --test-name=Endurance-test-JEDEG-219-workload

  • Just logging: Default logging is run for 20 hours and log every 10 hours. 

    # nvme virtium save-smart-to-vtview-log /dev/yourDevice

NVME

Part of the nvme-user suite